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Raúl Sánchez
AÑO 2016
14/04/2016
An FPGA-based Emulation Platform for Evaluation of Time-Interleaved ADC Calibration Systems
Autores
Raúl M. Sanchez, Benjamín T. Reyes, Ariel L. Pola, and Mario R. Hueda  

This work describes a 1 Gb/s digital communication system implemented on an FPGA-based platform to investigate mixed-signal calibration techniques of time-interleaved analog-to-digital converters (TI-ADCs). Design of multi-gigabit TI-ADCs is of great interest for next generation digital communication systems such as optical coherent networks. In these applications, mismatches of the sampling time, gain, offset, and frequency response among the interleaves of a TI-ADC limit the performance of the converter unless they are compensated. Typically, long computer simulation run time is required to evaluate the performance of mixed-signal calibration algorithms. We show that the FPGA-based system described in this paper drastically reduces the emulation time by more than hundreds of magnitude orders. The proposed FPGA framework includes: (i) a diagnostic and control unit built upon an embedded processor NIOSII, (ii) DSP blocks to implement the transmitter and the receiver, and (iii) a Gaussian number generator to emulate the noise channel component. Experimental results with a 2 GS/s 6-bit CMOS TI-ADC demonstrate the excellent capability of the implemented FPGA-based emulator to evaluate the performance of a mixed-signal calibration algorithm.

16/12/2016
Design and Experimental Evaluation of a Time-Interleaved ADC Calibration Algorithm for Application in High-Speed Communication Systems
Autores
Benjamín T. Reyes, Raúl M. Sanchez, Ariel L. Pola, and Mario R. Hueda  

In this work we investigate a new background calibration technique to compensate sampling phase errors in time-interleaved analog-to-digital-converters (TI-ADCs). Timing mismatches in TI-ADC degrade significantly the performance of ultra-high-speed digital transceivers. Unlike previous proposals, the calibration technique used here optimizes a metric directly related to the performance of the communication system. Estimation of gradient of the mean-squared-error (MSE) at the slicer with respect to the sampling phases of each interleave, are computed to minimize the time errors of the TI-ADC by controlling programmable analog time delay-cells. Since (i) dedicated digital signal processing (DSP) such as cross-correlations or digital filtering of the received samples are not required, and (ii) metrics such as MSE are available in most commercial transceivers, the implementation is reduced to a low speed state-machine. The technique is verified experimentally by using a programmable logic-based platform with a 2 GS/s 6-bit TI-ADC. The latter has been fabricated in $0.13μm CMOS process, and it provides flexible sampling phase control capabilities. Experimental results show that the signal-to-noise ratio penalty of a digital BPSK receiver caused by sampling time errors in TI-ADC, can be reduced from 1 dB to less than 0.1 dB at a bit-error-rate of 10 -6 .

AÑO 2014
26/05/2014
A 2GS/s 6-bit CMOS Time-Interleaved ADC for Analysis of Mixed-Signal Calibration Techniques
Autores
Benjamín T. Reyes · German Paulina · Raúl Sanchez · Pablo S. Mandolesi · Mario R. Hueda  

A 6-bit 2-GS/s time interleaved (TI) successive approximation register (SAR) analog-to-digital converter (ADC) is designed and fabricated in a 0.13 μm CMOS process. The architecture uses 8 time-interleaved track-and-hold amplifiers (THA), and 16 SAR ADC's. The chip includes (i) a programmable delay cell array to adjust the interleaved sampling phase, and (ii) a 12 Gbps low voltage differential signaling (LVDS) interface. These blocks make the fabricated ADC an excellent platform to evaluate mixed-signal calibration techniques, which are of great interest for application in high-speed optical systems. Measurements of the fabricated ADC show 33.9 dB of peak signal-to-noise-and-distortion ratio (SNDR) and 192 mW of power consumption at 1.2 V.

26/05/2014
A 6-bit 2GS/s CMOS Time-Interleaved ADC for Analysis of Mixed-Signal Calibration Techniques
Autores
Benjamín T. Reyes, Lucas Tealdi, German Paulina, Emanuel Labat, Raúl Sanchez, Pablo S. Mandolesi, and Mario R. Hueda  

A 6-bit 2-GS/s time interleaved (TI) successive approximation register (SAR) analog-to-digital converter (ADC) is designed and fabricated in a 0.13 μm CMOS process. The architecture uses 8 time-interleaved track-and-hold amplifiers (THA), and 16 SAR ADC's. The chip includes (i) a programmable delay cell array to adjust the interleaved sampling phase, and (ii) a 12 Gbps low voltage differential signaling (LVDS) interface. These blocks make the fabricated ADC an excellent platform to evaluate mixed-signal calibration techniques, which are of great interest for application in high-speed optical systems. Measurements of the fabricated ADC show 33.9 dB of peak signal-to-noise-and-distortion ratio (SNDR) and 192 mW of power consumption at 1.2 V.

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